X-ray Diffraction (XRD)

 

Materials property characterization from fundamental research to industrial quality control

Bruker's X-ray portfolio covers a wide range of X-ray scattering techniques for materials characterization and quality control of crystalline or non-crystalline materials such as powders, solid blocks, nanoparticles, thin films, epitaxial layers, or liquids.Techniques include X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS), diffuse or "total" scattering (PDF analysis), Small Angle X-Ray Scattering (SAXS) and analysis of amorphous, polycrystalline or epitaxial films using X-Ray Reflectometry (XRR), High-Resolution X-Ray Diffraction (HRXRD), Reciprocal Space Mapping (RSM). All of those can be executed on micron sized samples or areas of a larger sample called micro-XRD.Thanks to the DAVINCI design of the D8 ADVANCE and the D8 DISCOVER easy switching between all the applications can be performed on a single, multipurpose system.If XRPD is the main task, the D2 PHASER brings full performance in benchtop size and theD8 ENDEAVOR allows for automated, high sample throughput.

 


  • X-ray Powder Diffraction on Desktop Continuation of the success story The new D2 PHASER is the next generation desktop diffractometer for all X-ray powder diffraction applications in Bragg-Brentano geometry. It is equipped with an integrated flat screen monitor, an integrated PC running WINDOWS 8.1, and an ultra-fast SSD drive....